lab seme 2n2907adcsm dual high speed, medium power pnp switching transistor in a hermetically sealed ceramic surface mount package for high reliability applications features ? dual silicon planar epitaxial pnp transistors hermetic ceramic surface mount package cecc screening options space quality levels options high speed saturated switching applications: hermetically sealed dual surface mount version of the popular 2n2907a for high reliability / space applications requiring small size and low weight devices. per side v cbo collector - base voltage v ceo collector - emitter voltage v ebo emitter - base voltage i c collector current total device p d total device dissipation p d derate above 50c r ja thermal resistance junction to ambient r jc thermal resistance junction to case t stg, t j storage temperature, operating temp range ?60v ?60v ?5v -600ma 350mw 2.0mw / c 130c / w 60c / w ?55 to 200c mechanical data dimensions in mm (inches) lcc2 package underside view absolute maximum ratings (t c = 25c unless otherwise stated) pad 1 ? collector 1 pad 2 ? base 1 pad 3 ? base 2 pad 4 ? collector 2 pad 5 ? emitter 2 pad 6 ? emitter 1 1 2 6 3 4 5 2.54 0.13 (0.10 0.005) 0.64 0.06 (0.025 0.003) 0.23 (0.009) 1.40 0.15 (0.055 0.006) 1.65 0.13 (0.065 0.005) 2.29 0.20 (0.09 0.008) rad. a 1.27 0.13 (0.05 0.005) a = 6.22 0.13 (0.245 0.005) 4.32 0.13 (0.170 0.005) document number 7581 issue 1 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk semelab plc reserves the right to change test conditions, parameter limits and package dimensions without notice. information f urnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omi ssions discovered in its use. semelab encourages customers to verify that datasheets are current before placing orders.
lab seme 2n2907adcsm parameter test conditions min. typ. max. unit parameter test conditions min. typ. max. unit electrical characteristics per side (t c = 25c unless otherwise stated) i c = -10ma i c = -10 a i e = -10 ai c = 0 v ce = -30v v be = -0.5v i e = 0 v cb = -50v t c = 125c v ce = -30v v be = -0.5v i c = -150ma i b = -15ma i c = -500ma i b = -50ma i c = -150ma i b = -15ma i c = -500ma i b = -50ma i c =- 0.1ma v ce = -10v i c = -1.0ma v ce = -10v i c = -10ma v ce = -10v i c = -150ma v ce = -10v i c = -500ma v ce = -10v v ceo(br)* collector ? emitter breakdown voltage v cbo(br)* collector ? base breakdown voltage v (br)ebo* emitter ? base breakdown voltage i cex* collector cut-off current i cbo* collector ? base cut-off current i beo base cut-off current v ce(sat)* collector ? emitter saturation voltage v be(sat)* base ? emitter saturation voltage h fe* dc current gain ?60 ?60 ?5 -50 -0.01 -10 -50 ?0.4 ?1.6 ?1.3 ?2.6 75 100 100 100 300 50 v v v na a na v v ? f t transition frequency c ob output capacitance c ib input capacitance i c = -50ma v ce = -20v f = 100mhz v cb = -10v i e = 0 f = 1.0mhz v be = -2v i c = 0 f = 1.0mhz 200 8 30 mhz pf pf * pulse test t p = 300 s , 2% dynamic characteristics per side (t c = 25c unless otherwise stated) parameter test conditions min. typ. max. unit v cc = -30v i c = -150ma i b1 = -15ma t on turn-on time t off turn-off time 45 300 ns ns switching characteristics per side (resistive load) (t c = 25c unless otherwise stated) document number 7581 issue 1 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk semelab plc reserves the right to change test conditions, parameter limits and package dimensions without notice. information f urnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omi ssions discovered in its use. semelab encourages customers to verify that datasheets are current before placing orders.
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